Automated Visual Inspection

Automated Visual Inspection (AVI) specializes in advanced defect disposition and measurement techniques for photomasks, focusing on the critical challenges posed by shrinking chip geometries in semiconductor manufacturing. Their innovative Flux-Area measurement technique enhances defect sizing accuracy and repeatability, enabling effective defect specifications that adapt to modern lithography processes.

AVI's solutions address the complexities of mask defect evaluation by correlating mask defects with wafer outcomes, allowing chip manufacturers to achieve reliable quality control while minimizing repair-related risks. Their commitment to precision in photomask metrology fosters improved lithography processes and enhanced wafer yield in the semiconductor industry.

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